• DocumentCode
    31287
  • Title

    Discriminative Multimetric Learning for Kinship Verification

  • Author

    Haibin Yan ; Jiwen Lu ; Weihong Deng ; Xiuzhuang Zhou

  • Author_Institution
    Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    9
  • Issue
    7
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    1169
  • Lastpage
    1178
  • Abstract
    In this paper, we propose a new discriminative multimetric learning method for kinship verification via facial image analysis. Given each face image, we first extract multiple features using different face descriptors to characterize face images from different aspects because different feature descriptors can provide complementary information. Then, we jointly learn multiple distance metrics with these extracted multiple features under which the probability of a pair of face image with a kinship relation having a smaller distance than that of the pair without a kinship relation is maximized, and the correlation of different features of the same face sample is maximized, simultaneously, so that complementary and discriminative information is exploited for verification. Experimental results on four face kinship data sets show the effectiveness of our proposed method over the existing single-metric and multimetric learning methods.
  • Keywords
    face recognition; feature extraction; learning (artificial intelligence); probability; discriminative multimetric learning method; face descriptors; face image characterization; face image pair probability; face kinship data sets; facial image analysis; feature descriptors; kinship verification; multiple distance metrics; multiple feature extraction; single-metric learning method; Correlation; Data mining; Face; Feature extraction; Learning systems; Measurement; Training; Kinship verification; biometrics; discriminative learning; face recognition; multi-metric learning;
  • fLanguage
    English
  • Journal_Title
    Information Forensics and Security, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1556-6013
  • Type

    jour

  • DOI
    10.1109/TIFS.2014.2327757
  • Filename
    6824230