• DocumentCode
    3128751
  • Title

    Short-channel like effects in Schottky barrier carbon nanotube field-effect transistors

  • Author

    Appenzeller, J. ; Knoch ; Martel, R. ; Derycke, V. ; Wind, S. ; Avouris, Ph.

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2002
  • fDate
    8-11 Dec. 2002
  • Firstpage
    285
  • Lastpage
    288
  • Abstract
    This study shows new results on vertically scaled carbon nanotube field-effect transistors (CNFETs) focusing in particular on short-channel effects. We show clear evidence that state-of-the-art CNFETs behave as Schottky barrier (SB) transistors and that SB-CNFETs exhibit a very distinct scaling behavior. The relevant scaling rules that have to be applied to ensure the desired device operation and to avoid short-channel-like effects of CNFETs are discussed for the first time.
  • Keywords
    Schottky barriers; carbon nanotubes; field effect transistors; nanoelectronics; C; Schottky barrier carbon nanotube FET; Schottky barrier transistors; scaling behavior; short-channel effects; vertically scaled carbon nanotube FETs; CNTFETs; Carbon nanotubes; Electric variables; FETs; Focusing; Nanoscale devices; Schottky barriers; Semiconductivity; Silicon; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2002. IEDM '02. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7462-2
  • Type

    conf

  • DOI
    10.1109/IEDM.2002.1175834
  • Filename
    1175834