Title :
Applying patterns to develop a product line architecture for statistical analysis software
Author :
Meister, Jürgen ; Reussner, Ralf ; Rohde, Martin
Author_Institution :
Oldenburg R&D Inst. for Comput. Sci.Tools & Syst., Germany
Abstract :
This paper discusses the role of patterns in product line design by introducing a pattern based product line architecture for statistical analysis software. Associated to the architecture is a pattern language describing the instantiation of concrete software products from the product line. As patterns document design decisions better than mere code, patterns hinder the architectural drift. Since stability and organized evolution is of high importance for long-term assets, the use of patterns and pattern languages is particularly interesting for product line architectures.
Keywords :
mathematics computing; object-oriented methods; object-oriented programming; software architecture; statistical databases; pattern based product line architecture; pattern language; product line design; software architecture; software patterns; statistical analysis software; Application software; Communication system control; Computer architecture; Data analysis; Multidimensional systems; Public healthcare; Research and development; Software maintenance; Software tools; Statistical analysis;
Conference_Titel :
Software Architecture, 2004. WICSA 2004. Proceedings. Fourth Working IEEE/IFIP Conference on
Print_ISBN :
0-7695-2172-X
DOI :
10.1109/WICSA.2004.1310712