Title :
Miniature radio frequency ion trap mass spectrometry
Author :
Maas, J.D. ; Xu, Wei ; Hendricks, Paul ; Chappell, William J.
Author_Institution :
Electr. Eng. Dept., Purdue Univ., West Lafayette, IN, USA
Abstract :
RF ion traps are useful in chemical analysis and have added benefits when scaled to smaller dimensions. For a miniature ion trap it is ideal to be able to predict the performance of the ion trap prior to fabrication in order to save time and optimize parameters. We have developed both the simulation and fabrication of scaled ion traps. The simulation tool allows us to model miniature ion traps in order to predict how the frequency and amplitude of the RF voltage could be scaled in order to optimize the performance of the ion trap. We demonstrate the performance of a scaled ion trap array fabricated through the integration of stereolithography on circuit board and compare its performance with our ion trajectory simulator.
Keywords :
particle traps; radiofrequency spectra; stereolithography; chemical analysis; circuit board; ion trajectory simulator; miniature radio frequency ion trap mass spectrometry; stereolithography; Analytical models; Chemical sensors; Drugs; Fabrication; Mass spectroscopy; Quantum computing; Radio frequency; Stability; Stereolithography; Voltage; Chemical analysis; Ion trap; Stereolithography;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5516819