Analyzing ordered categorical data from orthogonal array [chip resistor QC]

Author

Jeng, Yam-Chyn ; Guo, Shin-Ming

Author_Institution

Dept. of Ind. Manage., Kaohsiung Polytech. Inst., Taiwan

Volume

3

fYear

1995

fDate

22-25 Oct 1995

Firstpage

2828

Abstract

This paper studies a quality improvement case for an extremely thin and light chip resistor RC06. We use an L₁₈(2¹×3⁷) orthogonal array allocating 8 control factors in an experimental plan. The quality response data are inevitably considered to be ordered categorical. Six categories are classified for the quality of chips. Both Taguchi´s accumulation analysis method (1966) and Nair´s scoring scheme (1986) are employed in analyzing the data. Furthermore, we develop a weighted probability scoring scheme and a signal to noise (SN) ratio to reach an optimal solution. Finally, a comparison among the three approaches is made

Keywords

electron device manufacture; probability; production control; quality control; resistors; statistical analysis; ANOVA; Nair´s scoring scheme; S/N ratio; Taguchi method; accumulation analysis; chip resistor RC06; ordered categorical data; orthogonal array; quality control; weighted probability scoring scheme; Analysis of variance; Computational complexity; Data analysis; Dispersion; Electrical resistance measurement; Mass production; Resistors; Semiconductor device measurement; Signal to noise ratio; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Systems, Man and Cybernetics, 1995. Intelligent Systems for the 21st Century., IEEE International Conference on

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-2559-1

Type

conf

DOI

10.1109/ICSMC.1995.538211

Filename

538211