• DocumentCode
    3129316
  • Title

    Field electron emission device using silicon nano-wires

  • Author

    Sawada, Kazuaki ; Futagawa, Masato ; Arai, Yuji ; Kawano, Takeshi ; Takao, Hidekuni ; Ishida, Makoto

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Toyoliashi Univ. of Technol., Aichi, Japan
  • fYear
    2002
  • fDate
    8-11 Dec. 2002
  • Firstpage
    401
  • Lastpage
    404
  • Abstract
    We propose a novel smart field electron emission device using silicon nano-wires, and demonstrate field electron emission with a quite low operation voltage from a gated silicon nano-wire. The threshold voltage is about 13V and the value is similar to gated carbon-nanotube field emitter. The emission current reaches 10nA at 15V of gate voltage.
  • Keywords
    elemental semiconductors; intelligent structures; nanowires; silicon; vacuum microelectronics; 10 nA; 13 V; 15 V; Si; emission current; field electron emission device; gated nano-wires; operation voltage; smart device; threshold voltage; Carbon nanotubes; Circuits; Electron emission; MOSFETs; Nanoscale devices; Probes; Silicon; Size control; Threshold voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2002. IEDM '02. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7462-2
  • Type

    conf

  • DOI
    10.1109/IEDM.2002.1175863
  • Filename
    1175863