DocumentCode :
3129396
Title :
Investigation of parasitic electromagnetic radiation in multilayer packages and MCMs
Author :
Arnaudov, Radosvet G. ; Baev, Slavi R. ; Avdjiiski, Bojidar G.
Author_Institution :
RaySat BG Ltd., Sofia, Bulgaria
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
286
Lastpage :
291
Abstract :
Electromagnetic radiation from parallel-plate planes of power-return and ground pairs are investigated. Such structures are widely used in microwave multilayer packages, MCMs and could be the source of considerable electromagnetic interference (EMI) or simultaneously switching noise (SSI). Effective methods should be applied for damping and elimination of the radiated fields, especially in small areas and volumes. The developed three-layered LTCC microwave package possesses two separate grounding planes on different layer levels, connected through multiple vias. The estimation of the electromagnetic field distribution - near field, and radiation pattern - far field, are conducted by full-wave analysis. The article also discusses the influence of the layout, vias grid and material properties on the performance of the exemplary structure in the frequency band of interest - 10 to 30 GHz.
Keywords :
electromagnetic interference; electromagnetic waves; electronics packaging; MCM; electromagnetic interference; full-wave analysis; multilayer packages; parasitic electromagnetic radiation; radiated emissions; simultaneously switching noise; Damping; Electromagnetic analysis; Electromagnetic fields; Electromagnetic interference; Electromagnetic radiation; Grounding; Material properties; Nonhomogeneous media; Packaging; Pattern analysis; LTCC; MCM; Microwave packages; electromagnetic interference (EMI); electronic band-gap structures (EBG); full-wave analysis; propagation constant; radiated emissions; simultaneous switching noise interference (SSI); wave number;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382118
Filename :
5382118
Link To Document :
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