DocumentCode
3129454
Title
Plantar Pressure Parameters for Dynamic Gait Stability Analysis
Author
Lemaire, E.D. ; Biswas, A. ; Kofinan, J.
Author_Institution
Inst. for Rehabilitation Res. & Dev., Ottawa Hosp. Rehabilitation Centre, Ont.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4465
Lastpage
4468
Abstract
Dynamic stability measurement is necessary to evaluate human performance over a variety of locomotor environments. In this paper, the suitability of parameters extracted from plantar-pressure measurements as input into a dynamic stability model was investigated. FScan in-shoe pressure data were collected from 15 subjects as they completed four successively more unstable walking tasks. Six parameters met the criteria of being reliably calculated from plantar pressure data, increasing as the task became more unstable, and relating to past measures from the literature: anterior/posterior centre of force (CoF) position, medio-lateral CoF position, double support time, stance time, cell triggering frequency, and maximum lateral CoF position. These parameters could be combined to create an index of dynamic gait stability
Keywords
gait analysis; mechanoception; neurophysiology; parameter estimation; pressure measurement; FScan in-shoe pressure data; cell triggering frequency; double support time; dynamic gait stability analysis; dynamic stability measurement; human performance; locomotor environments; medio-lateral centre-of-force position; parameter extraction; plantar pressure parameters; stance time; Data mining; Force measurement; Frequency measurement; Humans; Legged locomotion; Position measurement; Power capacitors; Pressure measurement; Stability analysis; Time measurement; Biomechanics; Equipment Design; Foot; Gait; Humans; Musculoskeletal Equilibrium; Posture; Pressure; Range of Motion, Articular; Shoes; Stress, Mechanical; Time Factors; Walking; Weight-Bearing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Type
conf
DOI
10.1109/IEMBS.2006.259847
Filename
4462793
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