DocumentCode :
3129477
Title :
Aging effects on interfacial reactions between Cu addition into the Sn-9Zn lead-free solder and Au substrate
Author :
Liou, Wei-kai ; Yen, Yee-wen ; Jao, Chien-Chung
Author_Institution :
Grad. Inst. of Mater. Sci. & Technol., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
271
Lastpage :
273
Abstract :
This study investigates aging effects on interfacial reactions between Sn-9wt%Zn-x wt% (SZ-xCu) alloys and Au substrate. The Au3Zn7/AuZn2/AuZn and Au3Zn7/AuZn phases respectively formed in the SZ/Au and SZ-1Cu/Au couples aged at 160°C for 24 hours. Only the AuSn phase was found at the SZ-4 Cu/Au interface. Extending the aging time to 800 hours, Sn became a dominant diffusion element. Binary Au-Sn phases and the metastable Au-Zn-Sn ternary phase, Au33-36 Zn35-36Sn29-31, was formed at the interface. The aging effect causing the changes of dominant diffusion element and concentration of Zn, Cu in the solder is the main reasons to change the sequence of the IMC formation in the SZ-xCu/Au systems.
Keywords :
copper; gold; solders; tin alloys; zinc alloys; Au; Au3Zn7-AuZn2-AuZn; Cu; IMC; Sn-Zn; aging effects; interfacial reactions; intermetallic compounds; lead-free solder; temperature 160 C; time 24 hour; time 800 hour; Aging; Automatic speech recognition; Environmentally friendly manufacturing techniques; Gold; Large-scale systems; Lead; Signal processing; Speech processing; Speech recognition; Vocabulary; Au33–36; SZ-xCu alloy; Zn35–36Sn29–31; aging effect; interfacial reactions; metastable;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382122
Filename :
5382122
Link To Document :
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