DocumentCode
3129505
Title
Magneto-impedance sensor based on TAD for integration
Author
Tajima, S. ; Wu, P. ; Okuda, Y. ; Watanabe, T. ; Uchiyama, T.
Author_Institution
NAGOYA Univ., Nagoya, Japan
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
In our research, a field-programmable gate array (FPGA) and a time analogue to digital convertor (TAD) are used to develop a new magnetic-field measurement system, in addition to a MI sensor . The purpose of the proposed MI sensor system is mainly for integration onto chips using the method of removing the conventional analog components that are obstacles to integration of the circuit .
Keywords
field programmable gate arrays; magnetic field measurement; magnetic sensors; magnetoresistive devices; chips; field-programmable gate array; integration; magnetic-field measurement system; magneto-impedance sensor; time analogue to digital convertor; Amorphous magnetic materials; Magnetic circuits; Magnetic field measurement; Magnetic fields; Magnetomechanical effects; Sensor systems; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7156942
Filename
7156942
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