DocumentCode :
3130059
Title :
Electric field detachment of a uniformly charged dielectric sphere on a dielectric coated electrode
Author :
Feng, James Q. ; Hays, Dan A.
Author_Institution :
Wilson Center for Res. & Technol., Xerox Corp., Webster, NY, USA
Volume :
4
fYear :
1996
fDate :
6-10 Oct 1996
Firstpage :
1883
Abstract :
In the electrophotographic process, charged toner particles are transferred from one surface to another with an electric field. To enable electric field transfer of toner, the externally applied field strength must be greater than a threshold value so that the coulombic force can overcome the toner adhesion force at the residing surface. In this work, the threshold field strength to detach a uniformly charged dielectric sphere and the electrostatic adhesion force are determined efficiently by using the Galerkin finite element method to simultaneously solve the Laplace equation for the field distribution and an overall constraint equation for the force balance. This computational method is applicable to various problem configurations. For illustrative purposes, however, the authors consider the axisymmetric problem of electric field detachment of a uniformly charged dielectric sphere on a dielectric coated electrode. Their analysis is particularly focused on the dependence of the threshold detachment field strength and electrostatic adhesion force on the dielectric coating thickness and gap between electrodes
Keywords :
Galerkin method; Laplace equations; electric breakdown; electric charge; electrodes; electrophotography; electrostatics; finite element analysis; Galerkin finite element method; Laplace equation; charged toner particles; constraint equation; coulombic force; dielectric coated electrode; dielectric coating thickness; electric field detachment; electric field strength; electrophotographic process; electrostatic adhesion force; force balance; inter-electrode gap; threshold field strength; toner adhesion force; uniformly charged dielectric sphere; Adhesives; Coatings; Dielectrics; Electrodes; Electrostatic analysis; Finite element methods; Laplace equations; Moment methods; Photoreceptors; Pigmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
ISSN :
0197-2618
Print_ISBN :
0-7803-3544-9
Type :
conf
DOI :
10.1109/IAS.1996.563823
Filename :
563823
Link To Document :
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