Title :
Reliability of High-Power 1060-nm DBR Lasers
Author :
Nguyen, Hung Khanh ; Coleman, Sean ; Visovsky, Nick J. ; Li, Yabo ; Song, Kechang ; Davis, Ronald W., Jr. ; Hu, Martin H. ; Loeber, David A. ; Zah, Chung-en
Abstract :
We report highly reliable 1060-nm DBR lasers with a single-wavelength output power larger than 350 mW and a failure rate as low as 3.2 kFITs at a heat-sink temperature of 25degC and a gain current of 500 mA. The reliability data of the high-power 1060-nm DBR lasers under longest aging tests at the highest level of current and temperature stress have been obtained for the first time, to the best of our knowledge
Keywords :
distributed Bragg reflector lasers; laser beams; laser reliability; semiconductor lasers; 1060 nm; 25 C; 500 mA; DBR laser reliability; aging tests; current stress; failure rate; gain current; heat-sink temperature; high-power lasers; temperature stress; Accelerated aging; Distributed Bragg reflectors; Holography; Indium gallium arsenide; Optical modulation; Power generation; Power lasers; Quantum well lasers; Semiconductor lasers; Temperature;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278795
