• DocumentCode
    3130105
  • Title

    Highly reliable operation of 660nm laser diodes for POF data links

  • Author

    Mukai, Atsushi ; Ohgoh, Tsuyoshi ; Mukaiyama, Akihiro ; Asano, Hideki ; Hayakawa, Toshiro

  • Author_Institution
    Frontier Core-Technol. Labs., Fuji Photo Film Co. Ltd., Kanagawa
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    589
  • Lastpage
    590
  • Abstract
    More than 10,000 hours accelerated life tests have been carried out for 660 nm GaInP/AlGaInP laser diodes at 5mW output power. The median lifetime at 60°C is estimated to be 1 × 106 hours.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser beams; laser reliability; life testing; optical fibre communication; optical transmitters; semiconductor lasers; 5 mW; 60 C; 660 nm; GaInP-AlGaInP; accelerated life tests; laser power; median lifetime; plastic optical fiber data links; reliable laser diode operation; Diode lasers; Life estimation; Life testing; Lifetime estimation; Light sources; Optical attenuators; Optical fibers; Optical films; Power generation; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
  • Conference_Location
    Montreal, QC, Canada
  • Print_ISBN
    0-7803-9555-7
  • Electronic_ISBN
    0-7803-9555-7
  • Type

    conf

  • DOI
    10.1109/LEOS.2006.278814
  • Filename
    4054321
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3130105