Title :
Highly reliable operation of 660nm laser diodes for POF data links
Author :
Mukai, Atsushi ; Ohgoh, Tsuyoshi ; Mukaiyama, Akihiro ; Asano, Hideki ; Hayakawa, Toshiro
Author_Institution :
Frontier Core-Technol. Labs., Fuji Photo Film Co. Ltd., Kanagawa
Abstract :
More than 10,000 hours accelerated life tests have been carried out for 660 nm GaInP/AlGaInP laser diodes at 5mW output power. The median lifetime at 60°C is estimated to be 1 × 106 hours.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser beams; laser reliability; life testing; optical fibre communication; optical transmitters; semiconductor lasers; 5 mW; 60 C; 660 nm; GaInP-AlGaInP; accelerated life tests; laser power; median lifetime; plastic optical fiber data links; reliable laser diode operation; Diode lasers; Life estimation; Life testing; Lifetime estimation; Light sources; Optical attenuators; Optical fibers; Optical films; Power generation; Temperature;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, QC, Canada
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278814
