Title :
Improved calculation of finite element analysis of bipolar corona including ion diffusion
Author :
Al-Hamouz, Z. ; Abdel-Salam, M. ; Mufti, A.
Author_Institution :
Dept. of Electr. Eng., King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia
Abstract :
This paper presents an iterative method for the analysis of bipolar corona associated with the ionized field around high-voltage bipolar direct-current (HVDC) transmission line conductors. A new finite element technique (FET) is proposed to solve Poisson´s equation where the constancy of the conductors´ surface field at the corona onset value is directly implemented in the finite element formulation. Satisfying the current continuity condition and updating the space charge density are based on the application of Kirchoff´s current balance law at each node of the finite element grid and takes the ion diffusion into account. In order to investigate the effectiveness of the proposed method, a laboratory model was built. It has been found that the calculated V-I characteristics and the ground plane current density profiles agreed well with those measured experimentally. The simplicity in writing the computer program in addition to the low number of iterations required to achieve convergence characterize the new method of analysis
Keywords :
HVDC power transmission; Poisson distribution; corona; current density; electric charge; finite element analysis; iterative methods; power overhead lines; space charge; HVDC transmission line conductors; Kirchoff´s current balance law; Poisson´s equation; V-I characteristics; bipolar corona; computer program; conductors´ surface field; convergence; corona onset value; current continuity condition; finite element analysis; finite element grid; finite element technique; ground plane current density profiles; ion diffusion; ionized field; iterative method; space charge density; Conductors; Corona; FETs; Finite element methods; HVDC transmission; Iterative methods; Laboratories; Poisson equations; Space charge; Transmission lines;
Conference_Titel :
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3544-9
DOI :
10.1109/IAS.1996.563828