• DocumentCode
    3130295
  • Title

    Flux study for ultra fine pitch flip chip packages

  • Author

    Lee, Wen-Hao ; Lin, G.T. ; Chang, David ; Jiang, Jase ; Chen, Carl

  • Author_Institution
    Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    Flux used in 25um ultra fine pitch flip chip attachment process has been found to play an important role in the bump joint and performance. It is commonly used in cleaning the surfaces of solder balls and the surfaces to be soldered to ensure a good wetting of the solder bumps on the substrate pads. Here we use Cu pillar bump with solder cap and substrate pad surface finish is plating tin, and furthermore the standard reflow process was used to perform the evaluation. Due to higher bonding temperature requirement, a Pb-free compatible no clean flux is needed. This kind of flux is formulated to work well with small bump diameter and pitch which have low residual after reflow profile and low weight loss during the whole process. Of course they are achieving compatibility with the underfill. For this new generation flip chip products, how to select a suitable flux is the most challenge. This paper gives a detailed description of the challenges encountered during assembly, such as the flux selection process, flux height study. The characteristics of flux can be determined by using TGA, wet-ability test, and thermal resistance. For ultra fine pitch flip chip application, no clean and low residue flux is the basic demand. Besides, jetting type flux will be the best choice because the flux height is hard to control and the flux amount might not be enough to provide the solder joint ability. Finally, we conclude that the most rigid bonding method, and parameter for fine pitch Cu pillar bump flip chip package.
  • Keywords
    electronics packaging; flip-chip devices; solders; bonding temperature requirement; bump joint; flip chip products; flux height study; flux selection process; flux study; jetting type flux; low weight loss; reflow profile; solder balls; solder bumps; solder cap; standard reflow process; substrate pad surface finish; substrate pads; thermal resistance; ultra fine pitch flip chip packages; Assembly; Bonding; Flip chip; Packaging; Performance evaluation; Surface cleaning; Surface finishing; Temperature; Thermal resistance; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382166
  • Filename
    5382166