Title :
Signal Integrity of RZ Data in Micron-scale Silicon Ring Resonators
Author :
Lee, Benjamin G. ; Small, Benjamin A. ; Bergman, Keren
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY
Abstract :
This paper quantifies the signal degradation that results from sideband attenuation imposed on high speed RZ-OOK optical signals as they pass through high-Q microring resonators. In addition, we have experimentally verified a numerical model, which predicts the degree of signal distortion incurred by microring resonators as quantified by the power penalty
Keywords :
amplitude shift keying; integrated optics; micro-optomechanical devices; optical communication equipment; optical distortion; optical modulation; optical resonators; silicon; RZ-OOK optical signal; Si; high-Q microring resonator; power penalty; sideband attenuation; signal degradation; signal distortion; signal integrity; Bandwidth; Degradation; High speed optical techniques; Optical attenuators; Optical distortion; Optical filters; Optical modulation; Optical resonators; Optical ring resonators; Silicon;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278852
