Title : 
Self-repairing embryonic memory arrays
         
        
            Author : 
Prodan, Lucian ; Udrescu, Mihai ; Vladutiu, Mircea
         
        
            Author_Institution : 
Dept. of Comput. Eng., Politehnica Univ. ofTimisoara, Timisoara, Romania
         
        
        
        
        
        
            Abstract : 
Space applications endorse the quest for dependable computing as a vital requirement instead of an expendable quality indicator. A novel direction in designing digital systems with superior dependability is based on bio-inspiration. As a key representative, the Embryonics project implements bio-inspired robustness, the backbone of its fault tolerance being a two level hierachical self-repair. However, the outer space radiation-hard environment is especially harsh to electronic devices, causing a variety of errors (soft fails). The memory structures employed by Embryonics cannot be protected by its self-repairing mechanism. Therefore we investigate the causes and influences of soft fails over the current Embryonics framework and propose a solution for the identified vulnerability based on error correcting codes. We also provide a reliability comparison between memory structures with and without error correcting codes.
         
        
            Keywords : 
aerospace; digital systems; fault tolerance; memory architecture; self-adjusting systems; stability; Embryonics project; bio-inspiration; bio-inspired robustness; digital systems design; electronic devices; error correcting codes; fault tolerance; hierachical self-repair; memory structures; outer space radiation-hard environment; reliability; self-repairing embryonic memory arrays; self-repairing mechanism; superior dependability; Application software; Bioinformatics; Concurrent computing; Embryo; Error correction codes; Genomics; Military computing; Robustness; Space exploration; Space technology;
         
        
        
        
            Conference_Titel : 
Evolvable Hardware, 2004. Proceedings. 2004 NASA/DoD Conference on
         
        
            Print_ISBN : 
0-7695-2145-2
         
        
        
            DOI : 
10.1109/EH.2004.1310821