Title :
An immune inspired fault diagnosis system for analog circuits using wavelet signatures
Author :
Amaral, J.L.M. ; Amaral, J.F.M. ; Tanscheit, R. ; Pacheco, M.
Author_Institution :
Dept. of Electron. Eng., Rio de Janeiro State Univ., Brazil
Abstract :
This work focuses on fault diagnosis of electronic analog circuits. A fault diagnosis system for analog circuits based on wavelet decomposition and artificial immune systems is proposed. It is capable of detecting and identifying faulty components in analog circuits by analyzing its impulse response. The use of wavelet decomposition for preprocessing of the impulse response drastically reduces the size of the detector used by the Real-valued Negative Selection Algorithm (RNSA). Results have demonstrated that the proposed system is able to detect and identify faults in a Sallen-Key bandpass filter circuit.
Keywords :
analogue circuits; band-pass filters; electronic engineering computing; fault diagnosis; fault location; transient response; wavelet transforms; Sallen-Key bandpass filter circuit; artificial immune systems; electronic analog circuits; fault diagnosis system; impulse response; real-valued negative selection algorithm; wavelet decomposition; wavelet signatures; Analog circuits; Artificial immune systems; Circuit faults; Circuit testing; Continuous wavelet transforms; Electrical fault detection; Fault detection; Fault diagnosis; Immune system; Wavelet transforms;
Conference_Titel :
Evolvable Hardware, 2004. Proceedings. 2004 NASA/DoD Conference on
Print_ISBN :
0-7695-2145-2
DOI :
10.1109/EH.2004.1310822