• DocumentCode
    3130814
  • Title

    Assessment of silicon MOS and carbon nanotube FET performance limits using a general theory of ballistic transistors

  • Author

    Guo, Jing ; Datta, Supriyo ; Lundstrom, Mark ; Brink, Markus ; McEuen, Paul ; Javey, Ali ; Dai, Hongjie ; Kim, Hyoungsub ; McIntyre, Paul

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2002
  • fDate
    8-11 Dec. 2002
  • Firstpage
    711
  • Lastpage
    714
  • Abstract
    A simple model for ballistic nanotransistors, which extends previous work by treating both the charge control and the quantum capacitance limits of MOSFET-like transistors, is presented. We apply this new model to MOSFET-like carbon nanotube FETs (CNTFETs) and to MOSFETs at the scaling limit. The device physics for operation at ballistic and quantum capacitance limits are explored. Based on the analysis of recently reported CNTFETs, we compare CNTFETs to MOSFETs. The potential performance advantages over Si that might be achieved at the scaling limit are established by using the new model.
  • Keywords
    MOSFET; ballistic transport; carbon nanotubes; field effect transistors; nanoelectronics; semiconductor device models; silicon; C; FET performance limits; MOSFET-like C nanotube FETs; Si; Si MOSFETs; ballistic nanotransistors; ballistic transistor theory; carbon nanotube FET; charge control; device physics; model; quantum capacitance limits; scaling limit; CNTFETs; FETs; MOSFETs; Measurement; Physics; Quantum capacitance; Quantum computing; Quantum mechanics; Schottky barriers; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2002. IEDM '02. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7462-2
  • Type

    conf

  • DOI
    10.1109/IEDM.2002.1175937
  • Filename
    1175937