Drive only at speed functional testing; one of the techniques Intel is using to control test costs

"Drive only" at speed functional testing is defined to be where the ATE drives input stimulus at native data rates and the results are accumulated or checked on die and the test result is accessed and checked by the automatic test equipment, ATE, at a slow data rate. This paper summarizes the various "drive only" methods and associated DFT circuits that Intel has developed, some High Volume Manufacturing, HVM, results demonstrating our success and a discussion of how this has and will continue to lead to significant cost reductions, as compared to traditional Drive & Compare functional testing