Title :
Response prediction and verification for PCB with package due to thermal and random vibration coupling effects
Author :
Wang, Bor-Tsuen ; Hsu, Fu-Xiang ; Liang, Xiu-Wei ; Hung, Chen-Hsiung ; Lai, Yi-Shao ; Yeh, Chang-Lin ; Lee, Ying-Chih
Author_Institution :
Dept. of Mech. Eng., Nat. Pingtung Univ. of Sci. & Technol., Pingtung, Taiwan
Abstract :
The printed circuit board (PCB) subject to vibration and thermal couple loading is of great interest. This work presents both theoretical analysis and experimental verification for the PCB in heating condition subject to random vibration. The designed heating pad is used as the heating source attached to the package on PCB by providing constant temperature inputs. The calibrated finite element model of PCB in fixture condition is employed to perform thermal analysis for the PCB subjected to the fixed high temperature at the package surface. The thermal response of the PCB can be determined, and thus the spectrum response analysis of the PCB including the thermal effect for random excitation according to JEDEC specification is carried out. The temperature distribution over the PCB in heating condition is monitored by the digital infrared thermography and compared with that of finite element analysis (FEA). The acceleration spectral responses on the PCB during random vibration test with thermal effect are also recorded. Results show that the predicted temperature distribution for the heated PCB and acceleration response due to thermal and random vibration compound loadings agree reasonably between the FEA and experiments. The stress fields on the PCB subject to the thermal input and random vibration excitation can then be obtained and evaluated for its possible fatigue failures due to the compound loading effects. This work presents the analytical solutions via the commercial FE code for the PCB subject to compound loadings for thermal input and random vibration excitation. The predicted results are well validated by comparing with experiments. The developed methodology will be beneficial for further study of PCB and its package reliability in considering both thermal and vibration inputs simultaneously.
Keywords :
finite element analysis; infrared imaging; printed circuit testing; thermal analysis; vibrations; PCB; acceleration spectral responses; calibrated finite element model; digital infrared thermography; finite element analysis; package reliability; printed circuit board; random vibration coupling; response prediction; thermal analysis; thermal coupling; thermal response; Coupling circuits; Finite element methods; Fixtures; Infrared heating; Packaging; Performance analysis; Printed circuits; Temperature distribution; Thermal loading; Thermal stresses; PCB; random vibration; response prediction; thermal analysis;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
DOI :
10.1109/IMPACT.2009.5382202