Title :
Compression mode diagnosis enables high volume monitoring diagnosis flow
Author :
Leininger, Andreas ; Muhmenthaler, Peter ; Cheng, Wu-Tung ; Tamarapalli, Nagesh ; Yang, Wu ; Tsai, And Hans
Author_Institution :
Infineon Technol. AG
Abstract :
Diagnosis of scan test fail data plays a crucial role in enhancing ramp up of new CMOS technology generations. To enable faster feedback it is preferable to establish a monitoring diagnosis methodology on the production test floor. This paper reports result of a study on using test time optimized compressed scan technology and associated new algorithms for fault diagnosis. Data is based on a system-on-a-chip (SoC) product that is manufactured using Infineon Technologies´ 130 nm process. A comparison with uncompressed scan test and diagnosis shows feasibility of implementing a monitoring diagnosis flow with compressed scan test serving the high throughput test flow
Keywords :
CMOS integrated circuits; automatic test equipment; automatic test pattern generation; boundary scan testing; failure analysis; fault diagnosis; integrated circuit testing; statistical analysis; system-on-chip; 130 nm; CMOS technology; Infineon Technologies; compressed scan technology; compression mode diagnosis; fault diagnosis; high volume monitoring diagnosis flow; monitoring diagnosis methodology; production test floor; scan test fail data diagnosis; system-on-a-chip product; CMOS technology; Condition monitoring; Failure analysis; Fault diagnosis; Feedback; Manufacturing processes; Optimized production technology; System-on-a-chip; Testing; Throughput;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583972
