Title :
Multiple Probe Interactions in Near-field Imaging
Author :
Carney, P. Scott ; Sun, Jin ; Schotland, John C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
Abstract :
We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem
Keywords :
inverse problems; light scattering; near-field scanning optical microscopy; probes; inverse scattering problem; multiple probe interactions; near-field scanning optical microscopy; spectroscopic response; Apertures; Biomedical optical imaging; Inverse problems; Lighting; Optical imaging; Optical microscopy; Optical scattering; Probes; Spatial resolution; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278901
