• DocumentCode
    3131187
  • Title

    Imaging Sub-micron Scale Light Confinement in Silicon Waveguides with Apertureless Transmission-based Near-field Scanning Optical Microscopy

  • Author

    Robinson, Jacob T. ; Preble, Stefan F. ; Lipson, Michal

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    693
  • Lastpage
    694
  • Abstract
    We measure transverse optical decay lengths on the order of ¿/30 in sub-micron scale silicon waveguides using Transmission-based Near-field Scanning Optical Microscopy (TraNSOM), and compare these measurements to theory.
  • Keywords
    integrated optics; near-field scanning optical microscopy; optical variables measurement; optical waveguides; silicon; Si; apertureless transmission-based near-field scanning optical microscopy; silicon waveguides; sub-micron scale light confinement imaging; transverse optical decay length measurement; Optical imaging; Optical interferometry; Optical microscopy; Optical mixing; Optical scattering; Optical surface waves; Optical waveguides; Probes; Silicon; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
  • Conference_Location
    Montreal, QC, Canada
  • Print_ISBN
    0-7803-9555-7
  • Electronic_ISBN
    0-7803-9555-7
  • Type

    conf

  • DOI
    10.1109/LEOS.2006.278902
  • Filename
    4054373
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3131187