Title :
Subsurface Imaging with Widefield and Confocal Numerical Aperture Increasing Lens Microscopes
Author :
Köklü, F. Hakan ; Meydbray, Y. ; Behringer, Ernest R. ; Quesnel, Justin I. ; Karabacak, D. ; Ippolito, Stephen B. ; Goldberg, Bennett B. ; Unlu, M. Selim
Author_Institution :
Dept. of Phys., Electr. & Comput. Eng., Boston Univ., MA
Abstract :
We obtain lateral spatial resolutions of 0.88 mum and 0.29 mum with custom infrared widefield and confocal numerical aperture increasing lens microscopes, respectively, when imaging subsurface structures. We discuss the relative advantages of each microscope
Keywords :
image resolution; infrared imaging; lenses; optical images; optical microscopy; confocal numerical aperture; infrared widefield microscope; lateral spatial resolutions; numerical aperture increasing lens; subsurface structure imaging; Apertures; Chromium; H infinity control; Image resolution; Infrared imaging; Lenses; Microscopy; Nails; Sensor arrays; Spatial resolution;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278903
