Title :
J-MASS in the EW test and evaluation process
Author :
McQuay, William K. ; Allen, Kenneth R.
Author_Institution :
Wright Lab., USA
Abstract :
The Joint Modeling and Simulation System (J-MASS) is an integral part of the Air Force´s Electronic Warfare (EW) Test and Evaluation (T&E) Process. This paper discusses how J-MASS is employed and the requirements for modeling and simulation (M&S) in the EW T&E Process. The EW T&E Process is used by both government and contractors in all phases of the acquisition cycle. Its use implements a predict-test-compare philosophy and stresses adequate ground testing before implementing a flight testing methodology. The EW T&E concepts take advantage of current and emerging M&S technologies. The “predict pillar” of the T&E process is primarily supported by M&S tools. A digital system model (DSM) of the EW system under test is developed to run on a digital computer with other digital models, such as models of aircraft, threats, environment, and scenarios. The DSM is required by the EW T&E Process and must be compatible with J-MASS. A DSPM is a digital representation of the system under development and must be updated and maintained throughout the life cycle of the system. The DSM would normally be developed by the System Manager as a contract deliverable. The development, evolution, and employment of the DSM is discussed in detail
Keywords :
aerospace simulation; aircraft testing; digital simulation; electronic warfare; military aircraft; EW test; J-MASS; U.S. Air Force; acquisition cycle; aircraft models; digital system model; flight testing methodology; joint modeling and simulation system; predict-test-compare philosophy; scenarios; threats; Aircraft; Contracts; Digital systems; Electronic equipment testing; Electronic warfare; Government; Predictive models; Stress; System testing; Test facilities;
Conference_Titel :
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-2666-0
DOI :
10.1109/NAECON.1995.522027