Title :
A wideband low-noise ATE-based method for measuring jitter in GHz signals
Author :
Yamaguchi, Takahiro J. ; Ishida, Masahiro ; Soma, Mani
Author_Institution :
Advantest Labs., Ltd., Miyagi
Abstract :
This paper introduces a new method for measuring jitter in GHz signals using ATE. The wideband DeltaPhi method employs a frequency-shifting approach and has been verified experimentally to at least 2.5 GHz
Keywords :
automatic test equipment; jitter; automatic test equipment; frequency-shifting; jitter measurement; wideband DeltaPhi method; Bandwidth; Bit error rate; Frequency; Oscilloscopes; Performance evaluation; Sampling methods; Testing; Time measurement; Timing jitter; Wideband;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583980
