DocumentCode
3131366
Title
High-power-used thermal gel degradation Evaluation on board-level HFCBGA subjected to reliability tests
Author
Wang, Tong Hong ; Chen, Hsuan-Yu ; Lee, Chang-Chi ; Lai, Yi-Shao
Author_Institution
Central Product Solutions, Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
465
Lastpage
468
Abstract
HFCBGA is a thermally enhanced FCBGA with its heat spreader extending heat conduction area by connecting itself to the rear side of the silicon die. A thermal interface material plays an important role as a heat conduction path. The thermal performance should be checked not only at time zero, several types of reliability tests have to be examined to cover the field condition faced by end user. Temperature cycling test, highly-accelerated temperature and humidity stress test and multiple reflows are chosen for investigating thermal resistance of junction to case of a selected thermal gel.
Keywords
heat conduction; thermal management (packaging); board-level HFCBGA; heat conduction; heat spreader; hgh-power-used thermal gel degradation; highly-accelerated temperature; humidity stress test; reliability tests; temperature cycling test; thermal interface material; thermal resistance; Conducting materials; Humidity; Joining processes; Silicon; Temperature; Testing; Thermal conductivity; Thermal degradation; Thermal resistance; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382218
Filename
5382218
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