• DocumentCode
    3131366
  • Title

    High-power-used thermal gel degradation Evaluation on board-level HFCBGA subjected to reliability tests

  • Author

    Wang, Tong Hong ; Chen, Hsuan-Yu ; Lee, Chang-Chi ; Lai, Yi-Shao

  • Author_Institution
    Central Product Solutions, Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    465
  • Lastpage
    468
  • Abstract
    HFCBGA is a thermally enhanced FCBGA with its heat spreader extending heat conduction area by connecting itself to the rear side of the silicon die. A thermal interface material plays an important role as a heat conduction path. The thermal performance should be checked not only at time zero, several types of reliability tests have to be examined to cover the field condition faced by end user. Temperature cycling test, highly-accelerated temperature and humidity stress test and multiple reflows are chosen for investigating thermal resistance of junction to case of a selected thermal gel.
  • Keywords
    heat conduction; thermal management (packaging); board-level HFCBGA; heat conduction; heat spreader; hgh-power-used thermal gel degradation; highly-accelerated temperature; humidity stress test; reliability tests; temperature cycling test; thermal interface material; thermal resistance; Conducting materials; Humidity; Joining processes; Silicon; Temperature; Testing; Thermal conductivity; Thermal degradation; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382218
  • Filename
    5382218