Title :
Understanding NTF components from the field
Author_Institution :
Sun Microsyst., Inc., Sunnyvale, CA
Abstract :
No trouble found (NTF) parts are the bane of the test engineer´s existence, since it is difficult to determine the cause of a fail for a part that won´t. A companion paper (S. Davidson, 2005) discusses parts that are NTF after failing in the board or system factory. This paper discusses the issue of parts that fail in the field. We classify field NTFs, describe a method of determining the defect coverage of a component under board and system test, and describe how data mining techniques can be used to assist in explaining the causes of field NTFs
Keywords :
data mining; failure analysis; integrated circuit testing; NTF parts; board test; data mining; defect coverage; no trouble found; Data mining; Failure analysis; Microprocessors; Production facilities; Pulp manufacturing; Reliability engineering; Resource management; Sun; System testing; Waste materials;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583991
