Title :
Diagnosis with convolutional compactors in presence of unknown states
Author :
Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
The paper presents non-adaptive fault diagnosis techniques for scan-based designs. These schemes guarantee accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction in the presence of unknown states
Keywords :
boundary scan testing; convolution; fault diagnosis; convolutional compactors; nonadaptive fault diagnosis; scan-based designs; test response compaction; unknown states; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Convolutional codes; Cost function; Fault diagnosis; Graphics; Logic testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583998
