Reducing test cost through the use of digital testers for analog tests

The addition of extensive analog blocks to traditionally pure digital ASIC designs is driving the need to verify these analog functions. There are several possible solutions for verifying these analog blocks. These include design for test (DFT), mixed signal automated test equipment (ATE), and the use of custom measurement circuitry on a purely digital tester. This paper focuses entirely on the use of custom measurement circuitry on an otherwise purely digital tester