DocumentCode :
3131635
Title :
Determining shape and reflectance of Lambertian, specular, and hybrid surfaces using extended sources
Author :
Nayar, Shree K. ; Ikeuchi, Katsushi ; Kanade, Takeo
Author_Institution :
Robotics Inst., Carnegie-Mellon Univ., Pittsburgh, PA, USA
fYear :
1989
fDate :
10-12 Apr 1989
Firstpage :
169
Lastpage :
175
Abstract :
A method is presented for determining the shape of surfaces whose reflectance properties can vary from Lambertian to specular, without prior knowledge of the relative strengths of the Lambertian and specular components of reflection. The object surface is illuminated using extended light sources and is viewed from a single direction. Surface illumination using extended sources makes it possible to ensure the detection of both Lambertian and specular reflections. Multiple source directions are used to obtain an image sequence of the object. An extraction algorithm uses the set of image intensity values measured at each surface point to compute orientation as well as relative strengths of the Lambertian and specular reflection components. The method, photometric sampling, uses samples of a photometric function that relates image intensity to surface orientation, reflectance, and light source characteristics. Experiments conducted on Lambertian surfaces, specular surfaces, and hybrid surfaces show high accuracy in measured orientations and estimated reflectance parameters
Keywords :
computerised pattern recognition; computerised picture processing; Lambertian surfaces; detection; extended light sources; extended sources; extraction algorithm; hybrid surfaces; image intensity values; image sequence; multiple source directions; object surface; orientation; photometric function; photometric sampling; reflectance determination; reflectance properties; relative strengths; shape determination; specular reflections; specular surfaces; surface illumination; surface orientation; surface point; Data mining; Image sampling; Light sources; Lighting; Optical reflection; Photometry; Reflectivity; Rough surfaces; Shape measurement; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Applications of Machine Intelligence and Vision, 1989., International Workshop on
Conference_Location :
Tokyo
Type :
conf
DOI :
10.1109/MIV.1989.40544
Filename :
40544
Link To Document :
بازگشت