DocumentCode
3131697
Title
Analyzing second-order effects between optimizations for system-level test-based model generation
Author
Margaria, Tiziana ; Raffelt, Harald ; Steffen, Bernhard
Author_Institution
Gottingen Univ.
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
467
Abstract
Test-based model generation by classical automata learning is very expensive. It requires an impractically large number of queries to the system, each of which must be implemented as a system-level test case. Key towards the tractability of observation based model generation are powerful optimizations exploiting different kinds of expert knowledge in order to drastically reduce the number of required queries, and thus the testing effort. In this paper, we present a thorough experimental analysis of the second-order effects between such optimizations in order to maximize their combined impact
Keywords
automatic test pattern generation; expert systems; learning automata; optimisation; classical automata learning; expert knowledge; observation based model generation; query reduction; second-order effects; system-level test; test-based model generation; Application software; Automatic testing; Hardware; Intellectual property; Learning automata; Power generation; Power system modeling; Production systems; Software systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584006
Filename
1584006
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