DocumentCode :
3131713
Title :
Efficient tracking of large classes of experts
Author :
György, András ; Linder, Tamás ; Lugosi, Gábor
Author_Institution :
Dept. of Comput. Sci., Univ. of Alberta, Edmonton, AB, Canada
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
885
Lastpage :
889
Abstract :
In the framework of prediction with expert advice we consider prediction algorithms that compete against a class of switching strategies that can segment a given sequence into several blocks and follow the advice of a different “base” expert in each block. The performance is measured by the regret defined as the excess loss relative to the best switching strategy selected in hindsight. Our goal is to construct low-complexity prediction algorithms for the case where the set of base experts is large. In particular, starting with an arbitrary prediction algorithm A designed for the base expert class, we derive a family of efficient tracking algorithms that can be implemented with time and space complexity only O(ηγ In n) times larger than that of A, where n is the time horizon and γ ≥ 0 is a parameter of the algorithm. With A properly chosen, our algorithm achieves a regret bound of optimal order for γ >; 0, and only O(ln n) times larger than the optimal order for γ = 0 for all typical regret bound types we examined. For example, for predicting binary sequences with switching parameters, our method achieves the optimal O(ln n) regret rate with time complexity O(n1+γ In n) for any γ ϵ (0,1).
Keywords :
binary sequences; computational complexity; prediction theory; switching theory; binary sequence prediction; large expert classes; low-complexity prediction algorithms; optimal O(ln n) regret rate; performance measurement; prediction framework; regret bound; space complexity; switching parameters; switching strategies; time complexity; time horizon; tracking algorithms; Algorithm design and analysis; Encoding; Prediction algorithms; Redundancy; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Proceedings (ISIT), 2012 IEEE International Symposium on
Conference_Location :
Cambridge, MA
ISSN :
2157-8095
Print_ISBN :
978-1-4673-2580-6
Electronic_ISBN :
2157-8095
Type :
conf
DOI :
10.1109/ISIT.2012.6284689
Filename :
6284689
Link To Document :
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