DocumentCode :
3131724
Title :
Balancing mask and lithography costs
Author :
Bonn, Jeffrey ; Sisler, Sharon ; Tivnan, Patricia
Author_Institution :
IBM Corp., Essex Junction, VT, USA
fYear :
2001
fDate :
2001
Firstpage :
25
Lastpage :
27
Abstract :
This paper describes a fundamental change in strategy to balance mask and lithography costs at a multi-technology, multi-part number IBM Microelectronics semiconductor fabricator. The strategy is to reduce mask costs by printing fewer chips in each exposure whenever it is cost effective to do so. This paper discusses the advantages and drawbacks of this strategy, describes ways to implement it with the least impact on lithography tool productivity, and shows how to calculate the cost trade-off between mask costs and lithography costs
Keywords :
integrated circuit economics; integrated circuit technology; manufacturing resources planning; masks; photolithography; strategic planning; chip printing per exposure; cost effectiveness; cost trade-off; lithography costs; lithography tool productivity; mask cost reduction; mask costs; mask/lithography cost balancing; multi-technology multi-part number semiconductor fabricator; production strategy; Costs; Lenses; Lithography; Manufacturing; Microelectronics; Printing; Production; Productivity; Rivers; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI
Conference_Location :
Munich
ISSN :
1078-8743
Print_ISBN :
0-7803-6555-0
Type :
conf
DOI :
10.1109/ASMC.2001.925610
Filename :
925610
Link To Document :
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