Title :
A vector-based approach for power supply noise analysis in test compaction
Author :
Wang, Jing ; Yue, Ziding ; Lu, Xiang ; Qiu, Wangqi ; Shi, Weiping ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
Abstract :
Excessive power supply noise can lead to overkill during delay test. A static test vector compaction solution is described to prevent such overkill. Low-cost power supply noise models are developed and used in compaction. An error analysis of these models is given. This paper improves on prior work in terms of models and algorithm to increase accuracy and performance. Experimental results are given on ISCAS89 circuits
Keywords :
error analysis; integrated circuit modelling; integrated circuit noise; integrated circuit testing; power supply circuits; delay test; error analysis; low-cost power supply noise models; power supply noise analysis; static test vector compaction; Circuit faults; Circuit noise; Circuit testing; Compaction; Crosstalk; Delay; Noise level; Power supplies; Semiconductor device noise; Timing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584012
