DocumentCode
3131927
Title
Analysis of error-masking and X-masking probabilities for convolutional compactors
Author
Arai, Masayuki ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko
Author_Institution
Tokyo Metropolitan Univ.
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
570
Abstract
Convolutional compactors offer a promising technique of compacting test responses that include unknown values. One drawback of this compaction technique is error masking, i.e., some errors appearing in the test responses cannot be detected due to mutual cancellation. In this work, we theoretically analyze error-masking probability. First, we apply weight distributions of binary linear error-correcting codes to derive the error-masking probability. We then present a fast calculation scheme for 4- and 6-error-masking probabilities. Numerical examples reveal that they are about the same as those obtained by Monte-Carlo simulations. We also analyze X-masking probability, that is, the probability that an error is masked by unknown values. We present tree-search-based calculation, as well as approximated value
Keywords
built-in self test; data compression; error handling; integrated circuit testing; logic testing; probability; Monte-Carlo simulations; X-masking probability; binary linear error-correcting codes; convolutional compactors; error-masking probability; numerical examples; tree-search-based calculation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolutional codes; Costs; Error analysis; Error correction codes; Probability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584017
Filename
1584017
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