DocumentCode
3132014
Title
Research on evaluation method of electronic product maturity
Author
Jie, Huang ; Zhaofeng, Gao ; Kui, Zhang
Author_Institution
Electron. Reliability Eng. & Technol. Co. Ltd., China Electron. Technol. Group Corp., Shijiazhuang, China
Volume
2
fYear
2011
fDate
20-21 Aug. 2011
Firstpage
118
Lastpage
121
Abstract
Maturity evaluation is the most effective technological approach to reduce the developing risk of electronic product. The existing maturity standards at home and abroad could only estimate the independent technology from a single dimension. They are not enough to describe the technology integration. Simultaneously the definition of each maturity level is so simple and subjective that it is difficult to offer comprehensive and effective maturity evaluation for product. Aiming at these shortages, this paper gives an overall expansion for technology readiness level (TRL) from two aspects as technology integration and technology dimension, establishes a structural describe and measure model of military product maturity, proposes a quantitative computing method of product maturity based on questionnaire using Analytic Hierarchy Process (AHP) and attribute mathematics, and realizes all-round evaluation of product maturity objectively.
Keywords
decision making; electronic products; military equipment; performance evaluation; product life cycle management; risk analysis; technology management; AHP method; analytic hierarchy process; electronic product maturity evaluation method; military product maturity; quantitative computing method; risk reduction; technology dimension; technology integration; technology readiness level; Analytical models; Electronic equipment; Manufacturing; Mathematics; Prototypes; Weapons; Weight measurement; electronic product; product maturity level; technical dimension; technical integration; technology readiness level;
fLanguage
English
Publisher
ieee
Conference_Titel
Computing, Control and Industrial Engineering (CCIE), 2011 IEEE 2nd International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-9599-3
Type
conf
DOI
10.1109/CCIENG.2011.6008081
Filename
6008081
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