• DocumentCode
    3132014
  • Title

    Research on evaluation method of electronic product maturity

  • Author

    Jie, Huang ; Zhaofeng, Gao ; Kui, Zhang

  • Author_Institution
    Electron. Reliability Eng. & Technol. Co. Ltd., China Electron. Technol. Group Corp., Shijiazhuang, China
  • Volume
    2
  • fYear
    2011
  • fDate
    20-21 Aug. 2011
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    Maturity evaluation is the most effective technological approach to reduce the developing risk of electronic product. The existing maturity standards at home and abroad could only estimate the independent technology from a single dimension. They are not enough to describe the technology integration. Simultaneously the definition of each maturity level is so simple and subjective that it is difficult to offer comprehensive and effective maturity evaluation for product. Aiming at these shortages, this paper gives an overall expansion for technology readiness level (TRL) from two aspects as technology integration and technology dimension, establishes a structural describe and measure model of military product maturity, proposes a quantitative computing method of product maturity based on questionnaire using Analytic Hierarchy Process (AHP) and attribute mathematics, and realizes all-round evaluation of product maturity objectively.
  • Keywords
    decision making; electronic products; military equipment; performance evaluation; product life cycle management; risk analysis; technology management; AHP method; analytic hierarchy process; electronic product maturity evaluation method; military product maturity; quantitative computing method; risk reduction; technology dimension; technology integration; technology readiness level; Analytical models; Electronic equipment; Manufacturing; Mathematics; Prototypes; Weapons; Weight measurement; electronic product; product maturity level; technical dimension; technical integration; technology readiness level;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing, Control and Industrial Engineering (CCIE), 2011 IEEE 2nd International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-9599-3
  • Type

    conf

  • DOI
    10.1109/CCIENG.2011.6008081
  • Filename
    6008081