Production-oriented interface testing for PCI-Express by enhanced loop-back technique

Author

Lin, Mitchell ; Cheng, Kwang-Ting Tim ; Hsu, Jimmy ; Sun, Mc ; Chen, Jason ; Lu, Shelton

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA

fYear

2005

fDate

8-8 Nov. 2005

Lastpage

670

Abstract

Testing PCI-Express (PCI-E) interface at 2.5Gb/s in production is challenging and very expensive. This paper proposes a low-cost test method which could inject data-dependent and bounded random jitters into conventional external loop-back testing configuration, and also could test the jitter tracking capability of the data recovery circuit. This method has been implemented for production testing for a PCI-E interface device, in which the receiver employs a 3times-oversampling data recovery circuit. We analyze the measurement data and study their correlation with the simulation model. We also discuss some important issues for achieving high test accuracy and coverage using loop-back testing

Keywords

computer testing; conformance testing; jitter; peripheral interfaces; production testing; 2.5 Gbit/s; PCI-Express testing; bounded random jitters; data recovery circuit; data-dependent jitters; enhanced loop-back technique; interface testing; jitter tracking capability; loop-back testing; low-cost test; production-oriented testing; Automatic testing; Bandwidth; Circuit testing; Integrated circuit interconnections; Jitter; Physical layer; Production; Propagation losses; Time measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2005. Proceedings. ITC 2005. IEEE International

Conference_Location

Austin, TX

Print_ISBN

0-7803-9038-5

Type

conf

DOI

10.1109/TEST.2005.1584028

Filename

1584028