Title :
Test connections - tying application to process
Author :
Carulli, John M., Jr. ; Anderson, Thomas J.
Author_Institution :
Texas Instruments Inc., Dallas, TX
Abstract :
The ability to meet ever more demanding customer quality and reliability requirements is becoming increasingly difficult with each advancing technology generation. This issue becomes more complex as customer applications and requirements become more varied for the same basic technology. The customer applications range from cell phones and PDAs to servers to automotive. The reliability requirement descriptions vary from hundreds of defective parts per million (DPPM) to five nines availability to a zero defects culture. This paper focus on how customer quality and reliability expectations are influencing the perception and direction of test
Keywords :
customer satisfaction; production testing; quality assurance; reliability; customer applications; quality requirement; reliability requirements; test connections; Automotive engineering; Copper; Data mining; Dielectrics; Personal digital assistants; Power system reliability; Process design; Silicides; Space technology; System testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584030
