DocumentCode
3132169
Title
iNEMI solder paste deposition project - First stage review optimizing solder paste printing for large and small components
Author
Zhang, Shoukai ; Mohanty, Rita ; Jiang, Xiaodong ; Mao, Runsheng ; Lee, Jeffery ChangBing ; Xia, Chuan ; Sweatman, Keith ; Teoh, Desmond
Author_Institution
Huawei Technol., Zhenzhen, China
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
620
Lastpage
623
Abstract
The widely recognized industry standard IPC-7525 has been used as the starting point for an experimental program that explores the effect of varying the keep out distance for 0201 and 0402 chip components, CSP and SOP with pitches down to 0.4 mm, and larger components represented by CCGA. Other variables that were included in the experimental program to determine if they had an effect on the sensitivity of paste transfer to keep-out distance included stencil type, step height and solder type. In the first stage of the project the printing to each pad was measured with automated 3D SPI systems and optimum combinations of parameters identified by statistical analysis. In this paper the authors will explain the methodology chosen to achieve the project objectives and indicate the direction of likely future work. Early results indicate that a key objective of the project, to provide evidence to support the case for a reduction in the keep out distances below the current industry standard, might be achievable.
Keywords
printed circuit manufacture; soldering; standards; 0201 chip; 0402 chip; CCGA; CSP; IPC-7525 standard; SOP; iNEMI solder paste deposition; solder paste printing; Assembly; Australia; Indium; Integrated circuit packaging; Intserv networks; Mechanical factors; Paper technology; Printing; Statistical analysis; US Department of Transportation; Miniature and fine pitch components; consistency; keep-out distance; transfer efficiency;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382261
Filename
5382261
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