Title :
Use of MISRs for compression and diagnostics
Author :
Keller, Brion ; Bartenstein, Thomas
Author_Institution :
Cadence Design Syst., Inc., Endicott, NY
Abstract :
This paper describes a simple means for diagnosing failures by observing a compacted MISR output stream. While MISRs have been used in the industry for response compression, their use has often been seen as an impediment to diagnosis of failures. This paper shows how it is possible to use MISRs to perform a go/no-go failure test with very little data volume and to also use a compacted continuous stream of MISR output states to aid diagnosis
Keywords :
automatic test equipment; automatic test pattern generation; data compression; fault diagnosis; compacted MISR; compacted continuous stream; failure diagnosis; no-go failure test; response compression; Automatic test pattern generation; Automatic testing; Circuit testing; Digital circuits; Impedance; Logic testing; Performance evaluation; Sequential analysis; Software testing; Test pattern generators;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584036
