Title :
Logic proximity bridges
Author :
Tran, Eric N. ; Krishna, Vamsee ; Zachariah, Sujit ; Chakravarty, Sreejit
Abstract :
The notion of logic proximity bridge (LPB) is introduced. An algorithm to enumerate LPBs, using only the logic net-list, is discussed. Although no correlation exist between the LPB list and the realistic bridge list, LPB patterns are shown to compare very favorably with realistic bridge and n-detect patterns on several coverage metrics. This result points to the potential for LPB patterns as an alternative to both realistic bridge and n-detect patterns
Keywords :
automatic test pattern generation; fault diagnosis; logic testing; coverage metrics; logic net-list; logic proximity bridges; n-detect patterns; Bridges; Data analysis; Data mining; Educational institutions; Fault detection; Logic testing; Manufacturing; Scalability; Silicon; Test pattern generators;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584038
