DocumentCode
3132358
Title
A strategy for board level in-system programmable built-in assisted test and built-in self test
Author
Ferry, Joshua ; Scesnak, Jozef ; Shaikh, Shoeib
Author_Institution
ATE Operations Div., Teradyne, Inc., North Reading, MA
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
807
Abstract
In-system programmable (ISP) built-in self test (BIST) and built-in assisted test (BIAT) is a board test strategy that utilizes field programmable gate arrays (FPGAs), reconfigured solely for the application of test vectors. These test vectors are designed to either assure manufacturing & operational quality or assist in the functional verification. While mitigating lack of test access is the most prevalent application, increased device test capability as well as lower development times is realized in board test and system test
Keywords
boundary scan testing; built-in self test; field programmable gate arrays; printed circuit testing; FPGA; board test; built-in assisted test; built-in self test; field programmable gate arrays; functional verification; in-system programmable test; test access; test vectors; Automatic testing; Built-in self-test; Circuit testing; Design engineering; Field programmable gate arrays; Logic testing; Performance evaluation; Product design; Production; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584043
Filename
1584043
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