Title :
Word line pulsing technique for stability fault detection in SRAM cells
Author :
Pavlov, Andrei ; Azimane, Mohamed ; De Gyvez, Jose Pineda ; Sachdev, Manoj
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Abstract :
Stability testing of SRAMs has been time consuming. This paper presents a new programmable DFT technique for detection of stability and data retention faults in SRAM cells. The proposed technique offers extended flexibility in setting the weak overwrite test stress, which allows to track process changes without time-consuming post-silicon design iterations. Moreover, it does not introduce extra circuitry in the SRAM array and surpasses the data retention test in test time and detection capability
Keywords :
SRAM chips; circuit stability; design for testability; fault diagnosis; fault location; integrated circuit reliability; SRAM array; SRAM cells; data retention faults; data retention test; design for testability; overwrite test stress; programmable DFT technique; stability fault detection; stability testing; word line pulsing; Circuit faults; Circuit noise; Circuit stability; Circuit testing; Degradation; Electrical fault detection; Fault detection; Random access memory; Stress; System-on-a-chip;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584045
