DocumentCode
3132457
Title
Simulation of Raman scattering from nonequilibrium phonons in InP and InAs
Author
Ferry, D.K. ; Grann, E.D. ; Tsen, K.T.
Author_Institution
Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
fYear
1995
fDate
9-13 May 1995
Firstpage
108
Lastpage
111
Abstract
Excitation of semiconductors by intense sub-picosecond laser beams has been a major method of studying the dynamics of far-from-equilibrium electron and hole systems. The thermalization of the initial distributions of these carriers probes the details of the band structure and the dynamics of electron-phonon interactions. We have used 0.6 ps laser pulses at 1.952 eV to study the generation of nonequilibrium LO phonons in both InP and InAs. These two materials provide a contrast in that the thermalization (relaxation) of the Raman signal probes different decay mechanisms. In InP, for example, we find that the decay of the Raman signal is dominated by the lifetime of the LO phonons. To the contrary, in InAs, our studies show that the decay of the Raman signal is dominated by the time required for particles to return to the Γ valley from the L valleys of the conduction band. This time is much larger than the LO phonon lifetime
Keywords
III-V semiconductors; Raman spectra; band structure; conduction bands; electron-phonon interactions; indium compounds; phonon spectra; Γ valley; 0.6 ps; 1.952 eV; InAs; InP; L valleys; LO phonon lifetime; Raman scattering; band structure; carrier initial distributions; conduction band; decay mechanisms; electron-phonon interaction dynamics; far-from-equilibrium electron systems; hole systems; intense sub-picosecond laser beams; nonequilibrium LO phonons; nonequilibrium phonons; semiconductor excitation; thermalization; Charge carrier processes; Electron beams; Indium phosphide; Laser beams; Laser excitation; Optical pulse generation; Phonons; Probes; Raman scattering; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location
Hokkaido
Print_ISBN
0-7803-2147-2
Type
conf
DOI
10.1109/ICIPRM.1995.522088
Filename
522088
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