Title :
High-frequency characterization of direct plated copper metallized substrate and its application on microwave circuit
Author :
Wei, Chien-Cheng ; Fan, Chin-Ta ; Chiang, Ta-Hsiang ; Chiu, Ming-Kuen ; Ru, Shao-Pin
Author_Institution :
Tong Hsing Electron. Ind., Ltd., Taipei Hsien, Taiwan
Abstract :
Direct plated copper (DPC) metallized substrate is introduced, characterized, and demonstrated in this paper. The proposed DPC metallized substrate has the main advantages of high-frequency characteristics and excellent thermal management, due to the use of ceramic substrate and metallized copper conductor. Besides, the DPC process also provides high circuit density, fine pitch, and low cost potential compared to other technologies, like direct bonded copper (DBC), Low-Temperature Cofired Ceramics (LTCC), and High-Temperature Cofired Ceramics (HTCC) processes. Therefore, to characterize the electrical properties of DPC substrate for high-frequency applications, a simple extraction method was adopted to carry out the correlated values of dielectric constant and dielectric loss at Ku-band. However, to validate the extracted parameters, a 10-GHz parallel-coupled line band-pass filter (BPF) was demonstrated by using the presented DPC substrate. This BPF has measured insertion loss of only 0.5dB and return loss of above 10dB in the passband. It obviously proved that the DPC metallized substrate is very capable for RF module packages and microwave components, with its excellent low loss performance.
Keywords :
band-pass filters; ceramic packaging; ceramics; copper; dielectric losses; integrated circuit packaging; microstrip filters; microstrip resonators; microwave filters; microwave integrated circuits; permittivity; substrates; thermal management (packaging); DPC substrate; Ku-band; RF module packages; dielectric constant; dielectric loss; direct bonded copper; direct plated copper metallized substrate; electrical properties; extraction method; frequency 10 GHz; high-frequency characteristics; high-temperature cofired ceramics; insertion loss; loss 0.5 dB; low-temperature cofired ceramics; microstrip parallel-coupled resonators; microwave circuit; microwave components; parallel-coupled line band-pass filter; passband; return loss; thermal management; Band pass filters; Ceramics; Copper; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric substrates; Metallization; Microwave circuits; Thermal management; Direct plated copper; band-pass filter; ceramic substrate; dielectric material; microstrip resonator; parallel-coupled line filter;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
DOI :
10.1109/IMPACT.2009.5382279