Title :
High speed differential pin electronics over 6.4 Gbps
Author :
Ohshima, Atsushi ; Nomura, Toshihira
Author_Institution :
Japan Product Dev., Center Credence Syst., Kanagawa-ken
Abstract :
A differential pin electronics IC was newly developed for testing over 6.4 Gbps. One PEIC consists of a fully differential driver and a comparator, and its mode can be changed on the fly for high speed I/O interface. The chip was designed not to degrade overall timing accuracy by interface between PEIC and DUT/ATE system
Keywords :
automatic test equipment; comparators (circuits); driver circuits; high-speed integrated circuits; integrated circuit testing; 6.4 Gbit/s; ATE system; DUT system; PEIC; automatic test equipment; device under test; differential comparator; differential driver; differential pin electronics integrated circuit; high speed I-O interface; high speed integrated circuit; Fiber reinforced plastics;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584051
