DocumentCode :
3132527
Title :
The PXI carrier: a novel approach to ATE instrument development
Author :
Kushnick, Eric B.
Author_Institution :
Advantest America, Inc., Santa Clara, CA
fYear :
2005
fDate :
8-8 Nov. 2005
Lastpage :
897
Abstract :
The PXI carrier is a module designed for OPENSTAR open-architecture ATE systems (Rajsuman and Masuda, 2004) that allows PXI instruments to be integrated into an ATE test head. The PXI carrier fixes several problems inherent in using PXI instruments for ATE, and allows quick turn-around of solutions that would otherwise require lengthy ATE module development. This paper describes the PXI carrier, and then describes two applications of the PXI carrier, an RF test module and a baseband AWG/digitizer module
Keywords :
automatic test equipment; peripheral interfaces; ATE instrument development; ATE test head; OPENSTAR open-architecture; PXI carrier; RF test module; automatic test equipment; baseband AWG; digitizer module; Application software; Backplanes; Baseband; Calibration; Connectors; Instruments; Integrated circuit testing; Production facilities; Radio frequency; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
Type :
conf
DOI :
10.1109/TEST.2005.1584054
Filename :
1584054
Link To Document :
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