Title :
I/sub DDQ/ test using built-in current sensing of supply line voltage drop
Author :
Xue, Bin ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
Abstract :
A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This noninvasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. The measurement results of a 350 nm test chip are described. The sensor achieves a resolution of 182 muA, with the promise of much higher resolution
Keywords :
analogue-digital conversion; built-in self test; electric potential; electric sensing devices; integrated circuit testing; 182 muA; 350 nm; BICS; IDDQ testing; analog-to-digital conversion; built-in current sensing; built-in current sensor; digital chopping; input signals; noninvasive procedure; quiescent current testing; scan chain readout; self-calibration; stochastic process; voltage drop; Analog-digital conversion; Current supplies; Degradation; Low-frequency noise; Sensor phenomena and characterization; Signal processing; Signal resolution; Stochastic processes; Testing; Voltage;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584061
